Studies from Dongguk University Update Current Data on Molecular Science (Enhanced Resistive Switching and Synaptic Characteristics of ALD Deposited AlN-Based RRAM by Positive Soft Breakdown Process)

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• Enhanced Resistive Switching and Synaptic Characteristics of ALD Deposited AlN-Based RRAM by Positive Soft Breakdown Process

  Research output: Contribution to journal › Article › peer-review