A 10-b 500MS/s CMOS cascaded folding A/D converter with a hybrid calibration and a prevision error correction logic

Junbum Han, Donggwi Choi, Kyungtae Kim, Daeyun Kim, Minkyu Song

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

In this paper, a 10-b 500MS/s A/D converter (ADC) with a hybrid calibration and a new error correction logic is discussed. The proposed ADC employs a single-channel cascaded folding-interpolating architecture whose folding rate (FR) is 25 and interpolation rate (IR) is 8. In order to overcome the disadvantage of offset error, at the open-loop amplifier, a hybrid self-calibration circuit is proposed. Further, a novel prevision digital error correction logic (DCL) for folding ADC is also described. The ADC prototype using 130nm 1P6M CMOS has a DNL of ±0.8LSB and an INL of ±1.0LSB. The measured SNDR is 52.34-dB and SFDR is 62.04-dBc when the input frequency is 78.15MHz at 500MS/s conversion rate. The SNDR of the ADC is 7-dB higher than the same circuit without the proposed calibration. The effective chip area is 1.55mm2 and the power dissipates 300mW including peripheral circuits at 1.2/1.5V power supply.

Original languageEnglish
Title of host publication2011 IEEE 9th International New Circuits and Systems Conference, NEWCAS 2011
Pages313-316
Number of pages4
DOIs
StatePublished - 2011
Event2011 IEEE 9th International New Circuits and Systems Conference, NEWCAS 2011 - Bordeaux, France
Duration: 26 Jun 201129 Jun 2011

Publication series

Name2011 IEEE 9th International New Circuits and Systems Conference, NEWCAS 2011

Conference

Conference2011 IEEE 9th International New Circuits and Systems Conference, NEWCAS 2011
Country/TerritoryFrance
CityBordeaux
Period26/06/1129/06/11

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