Abstract
In this paper, a 65 nm 1.2 V 7-bit 1GSPS folding-interpolation A/D converter with a digitally self-calibrated vector generator is proposed. The folding rate is 2 and the interpolation rate is 8. A selfcalibrated vector generation circuit with a feedback loop and a recursive digital code inspection is described. The circuit reduces the variation of the offset voltage caused by process mismatches, parasitic resistors, and parasitic capacitances. The chip has been fabricated with a 65 nm 1-poly 6-metal CMOS technology. The effective chip area is 0.87 mm2 and the power consumption is about 110 mW with a 1.2 V power supply. The measured SNDR is about 39.1 dB when the input frequency is 250 MHz at a 1 GHz sampling frequency. The measured SNDR is drastically improved in comparison with the same ADC without any calibration.
| Original language | English |
|---|---|
| Pages (from-to) | 1199-1205 |
| Number of pages | 7 |
| Journal | IEICE Transactions on Electronics |
| Volume | E94-C |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2011 |
Keywords
- A/D converter
- Folding
- Interpolation
- Offset error
- Self-calibration
Fingerprint
Dive into the research topics of 'A 65 nm 1.2 V 7-bit 1 GSPS folding-interpolation A/D converter with a digitally self-calibrated vector generator'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver