A low noise CMOS image sensor with a 14-bit two-step single-slope ADC and a column self-calibration technique

Woongtaek Lim, Jongyoon Hwang, Dongjoo Kim, Shiwon Jeon, Suho Son, Minkyu Song

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

In this paper, a low-noise CMOS Image Sensor (CIS) based on a 14-bit Two-Step Single-Slope ADC (TS SS ADC) and a column self-calibration technique is proposed. The TS SS ADC is good for the video system which requires fast operation because its conversion speed is faster than the Single Slope ADC (SS ADC) by more than 10 times. However, there are a lot of errors in the circuit operation on the connection point between the coarse block and the fine block due to the 2-step composition of the TS SS ADC. This makes it difficult to implement the TS SS ADC into the high resolution more than 10-bit and the product. In order to improve the drawbacks of TS SS ADC, a new 4-input comparator is discussed. Further, a column self-calibration technique to reduce the Fixed Pattern Noise (FPN) is also described. The chip has been fabricated by Samsung 0.13μm CIS technology. The measured conversion time of the ADC is 17μs and the high frame rate of 120 frames/s (fps) is achieved at the VGA resolution. The measured column FPN is 0.38LSB, and it is much lower than the other reported ones.

Original languageEnglish
Title of host publication2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages48-51
Number of pages4
ISBN (Electronic)9781479942428
DOIs
StatePublished - 2014
Event2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014 - Marseille, France
Duration: 7 Dec 201410 Dec 2014

Publication series

Name2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014

Conference

Conference2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014
Country/TerritoryFrance
CityMarseille
Period7/12/1410/12/14

Keywords

  • CIS
  • self-calibration
  • two-step single slope ADC

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