A new method to measure the signal quality for high-density recording systems
- Eing Seob Cho
- , Jae Wook Lee
- , Junghyun Lee
- , Eun Jin Ryu
- , Maxim Konakov
- , Jae Seong Shim
- , Hyun Soo Park
- Samsung
Research output: Contribution to journal › Conference article › peer-review
1
Scopus
citations