A physics-based statistical model for reliability of STT-MRAM considering oxide variability
- Chih Hsiang Ho
- , Georgios D. Panagopoulos
- , Soo Youn Kim
- , Yusung Kim
- , Dongsoo Lee
- , Kaushik Roy
- Purdue University
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
8
Scopus
citations