TY - JOUR
T1 - A Study on the Elimination of Thermal Reflections
AU - Batchuluun, Ganbayar
AU - Yoon, Hyo Sik
AU - Nguyen, Dat Tien
AU - Pham, Tuyen Danh
AU - Park, Kang Ryoung
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2019
Y1 - 2019
N2 - Recently, thermal cameras have been used in various surveillance and monitoring systems. In particular, in camera-based surveillance systems, algorithms are being developed for detecting and recognizing objects from images acquired in dark environments. However, it is difficult to detect and recognize an object due to the thermal reflections generated in the image obtained from a thermal camera. For example, thermal reflection often occurs on a structure or the floor near an object, similar to shadows or mirror reflections. In this case, the object and the areas of thermal reflection overlap or are connected to each other and are difficult to separate. Thermal reflection also occurs on nearby walls, which can be detected as artifacts when an object is not associated with this phenomenon. In addition, the size and pixel value of the thermal reflection area vary greatly depending on the material of the area and the environmental temperature. In this case, the patterns and pixel values of the thermal reflection and the object are similar to each other and difficult to differentiate. These problems reduce the accuracy of object detection and recognition methods. In addition, no studies have been conducted on the elimination of thermal reflection of objects under different environmental conditions. Therefore, to address these challenges, we propose a method of detecting reflections in thermal images based on deep learning and their elimination via post-processing. Experiments using a self-collected database (Dongguk thermal image database (DTh-DB), Dongguk items and vehicles database (DIV-DB)) and an open database showed that the performance of the proposed method is superior compared to that of other state-of-the-art approaches.
AB - Recently, thermal cameras have been used in various surveillance and monitoring systems. In particular, in camera-based surveillance systems, algorithms are being developed for detecting and recognizing objects from images acquired in dark environments. However, it is difficult to detect and recognize an object due to the thermal reflections generated in the image obtained from a thermal camera. For example, thermal reflection often occurs on a structure or the floor near an object, similar to shadows or mirror reflections. In this case, the object and the areas of thermal reflection overlap or are connected to each other and are difficult to separate. Thermal reflection also occurs on nearby walls, which can be detected as artifacts when an object is not associated with this phenomenon. In addition, the size and pixel value of the thermal reflection area vary greatly depending on the material of the area and the environmental temperature. In this case, the patterns and pixel values of the thermal reflection and the object are similar to each other and difficult to differentiate. These problems reduce the accuracy of object detection and recognition methods. In addition, no studies have been conducted on the elimination of thermal reflection of objects under different environmental conditions. Therefore, to address these challenges, we propose a method of detecting reflections in thermal images based on deep learning and their elimination via post-processing. Experiments using a self-collected database (Dongguk thermal image database (DTh-DB), Dongguk items and vehicles database (DIV-DB)) and an open database showed that the performance of the proposed method is superior compared to that of other state-of-the-art approaches.
KW - deep learning
KW - thermal imaging
KW - Thermal reflection
KW - thermal reflection detection
KW - thermal reflection removal
UR - http://www.scopus.com/inward/record.url?scp=85077056377&partnerID=8YFLogxK
U2 - 10.1109/ACCESS.2019.2957532
DO - 10.1109/ACCESS.2019.2957532
M3 - Article
AN - SCOPUS:85077056377
SN - 2169-3536
VL - 7
SP - 174597
EP - 174611
JO - IEEE Access
JF - IEEE Access
M1 - 8922715
ER -