A wide dynamic range CMOS image sensor based on a new gamma correction technique

Yeonseong Hwang, Jangwoo Lee, Daeyun Kim, Minkyu Song

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Many kinds of wide dynamic range (WDR) CMOS Image Sensors (CIS) have been developed, such as a multiple sampling, a multiple exposure technique, and so on. However, those techniques have some drawbacks of noise increasing, large power consumption, and huge chip area. In this paper, a new Single-Slope ADC (SS-ADC) for gamma correction with a nonlinear counter is described. Since the proposed scheme is easily implemented with a simple algorithm, we can reduce power consumption and chip area drastically. Further, the new SS-ADC for gamma correction enhances the Dynamic Range (DR) by 24dB. The proposed ADC, which has been fabricated using a 0.13um CIS process, achieves a 57.6dB SNDR at 50kS/s.

Original languageEnglish
Title of host publicationISOCC 2012 - 2012 International SoC Design Conference
Pages131-134
Number of pages4
DOIs
StatePublished - 2012
Event2012 International SoC Design Conference, ISOCC 2012 - Jeju Island, Korea, Republic of
Duration: 4 Nov 20127 Nov 2012

Publication series

NameISOCC 2012 - 2012 International SoC Design Conference

Conference

Conference2012 International SoC Design Conference, ISOCC 2012
Country/TerritoryKorea, Republic of
CityJeju Island
Period4/11/127/11/12

Keywords

  • CMOS image sensor
  • Gamma correction ADC
  • single-slope ADC
  • wide dynamic range

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