Abstract
A highly reliable small-signal parameter extraction method for parasitic elements of the 0.1-μm GaAs metamorphic high electron mobility transistors is presented. De-embedding scheme for the coplanar waveguide (CPW) feeding structure is utilised in this method in a frequency range of 0.5-110 GHz with an enhancement approach to the correction of source inductance parameter sensitivity derived from oscillating measurements. The parasitic extrinsic capacitances are determined by modelling an Π equivalent circuit including the interaction between the sub-model and the CPW feedings. From this method, the authors achieved the most accurate parameter prediction with an effective fitting error of 10.83% among the small-signal models reported to date.
| Original language | English |
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| Pages (from-to) | 134-140 |
| Number of pages | 7 |
| Journal | IET Microwaves, Antennas and Propagation |
| Volume | 10 |
| Issue number | 2 |
| DOIs | |
| State | Published - 29 Jan 2016 |