@inproceedings{bfca3b1cb2204efa9ac6310a7a4dccaf,
title = "An advanced TRIM command for extending lifetime of TLC NAND flash-based storage",
abstract = "In mobile market, the popularity of TLC-based flash storage is steadily growing due to its high capacity. In this paper, we study the relationship between TLC-based storage and log-structured file system in terms of lifetime of the storage device. We also propose a novel technique, called Segment Trimming, which helps to eliminate the unnecessary data migration inside TLC storage. Our experimental results clearly show that our technique reduces the unnecessary data migration by 83% on average, compared with the traditional approach.",
author = "Kirock Kwon and Kang, {Dong Hyun} and Jonggyu Park and Eom, {Young Ik}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 ; Conference date: 08-01-2017 Through 10-01-2017",
year = "2017",
month = mar,
day = "29",
doi = "10.1109/ICCE.2017.7889381",
language = "English",
series = "2017 IEEE International Conference on Consumer Electronics, ICCE 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "424--425",
editor = "Sanchez, {Daniel Diaz} and Jong-Hyouk Lee and Fernando Pescador",
booktitle = "2017 IEEE International Conference on Consumer Electronics, ICCE 2017",
address = "United States",
}