Analysis and reduction of voltage noise of multi-layer 3D IC with PEEC-based PDN and frequency-dependent TSV models

Seungwon Kim, Ki Jin Han, Seokhyeong Kang, Youngmin Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Three dimensional (3D) integrated circuit (IC) technology has been proposed and used to reduce the delay among layers by shortening interconnection with TSVs. However, large power and ground TSV structures generate voltage noise and cause additional IR-drop in power delivery network (PDN). In this work, we investigate and analyze the voltage noise in multiple layers 3D IC stacking with PEEC-based on-chip PDN and frequency-dependent TSV models. Then we propose multi-paired on-chip PDN structure for reducing voltage noise in a 3D IC. Our proposed PDN architecture can achieve approximately maximum 19% IR-drop reduction. In addition, layer dependency of 3D IC between the conventional and the proposed PDN models is analyzed.

Original languageEnglish
Title of host publicationISOCC 2014 - International SoC Design Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages124-125
Number of pages2
ISBN (Electronic)9781479951260
DOIs
StatePublished - 16 Apr 2015
Event11th International SoC Design Conference, ISOCC 2014 - Jeju, Korea, Republic of
Duration: 3 Nov 20146 Nov 2014

Publication series

NameISOCC 2014 - International SoC Design Conference

Conference

Conference11th International SoC Design Conference, ISOCC 2014
Country/TerritoryKorea, Republic of
CityJeju
Period3/11/146/11/14

Keywords

  • 3D IC
  • IR drop
  • PEEC
  • power delivery network (PDN)
  • S-parameter
  • TSV
  • voltage noise

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