Analysis of DC characteristics in GaN-based metal-insulator-semiconductor high electron mobility transistor with variation of gate dielectric layer composition by considering self-heating effect

  • In Tae Hwang
  • , Kyu Won Jang
  • , Hyun Jung Kim
  • , Sang Heung Lee
  • , Jong Won Lim
  • , Jin Mo Yang
  • , Ho Sang Kwon
  • , Hyun Seok Kim

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Analysis of DC characteristics in GaN-based metal-insulator-semiconductor high electron mobility transistor with variation of gate dielectric layer composition by considering self-heating effect'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science