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Annealing effects on the properties of electrodeposited cdsse thin films
T. Mahalingam
,
V. Dhanasekaran
, S. Rajendran
, G. Ravi
, Luis Ixtlilco
, P. J. Sebastian
Department of Electronics & Electrical Engineering
World Top 2% Scientist
Alagappa University
Universidad Politécnica Del Estado de Guerrero
Universidad Nacional Autónoma de México
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Material Science
Thin Films
100%
Scanning Electron Microscopy
20%
Surface (Surface Science)
20%
X-Ray Diffraction
20%
Morphology
20%
Heat Treatment
20%
Annealing
20%
Optical Property
20%
Film
20%
Diffraction Pattern
20%
Refractive Index
20%
Absorption Spectra
20%
Solid Solutions
20%
Engineering
Thin Films
100%
Annealing Temperature
40%
X-Ray Diffraction Pattern
20%
Band Gap
20%
Extinction Coefficient
20%
Refractive Index
20%
Real Part
20%
Refractivity
20%
Imaginary Part
20%
Polycrystalline
20%
Heat Treatment
20%
Solid Solutions
20%