Abstract
X-ray diffraction (XRD) and selected area electron diffraction pattern (SADP) results showed that the (Ga1-x Mnx) N nanorods had preferential c -axial growth direction. Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images showed that one-dimensional (Ga1-x Mnx) N nanorods without defects had c -axis-oriented crystalline wurzite structures. Atomic arrangements for the (Ga1-x Mnx) N nanorods grown on the Al2 O3 (0001) substrates are described on the basis of the XRD, the TEM, the SADP, and the HRTEM results.
Original language | English |
---|---|
Article number | 141919 |
Journal | Applied Physics Letters |
Volume | 92 |
Issue number | 14 |
DOIs | |
State | Published - 2008 |