Abstract
A method for anodic bonding of silicon on insulator (SOI) and glass wafers was presented. The surfaces to be bonded were cleaned by a combined ozone and UV cleaning step followed by mega-sonic DI water rinse. Bonding of SOI to glass at an applied voltage of 700 V was observed at a temperature of 400°C. The quality of bonding was also verified. Removal of the bulk silicon substrate was demonstrated, opening up new avenues for the integration of thin film electronics and inert materials for applications in bio-electronics.
Original language | English |
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Pages (from-to) | 2370-2372 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 12 |
DOIs | |
State | Published - 20 Sep 2004 |