Characterization of all-Nb nanodevices fabricated by electron beam lithography and ion beam oxidation
- Hyunsik Im
- , Yu A. Pashkin
- , T. Yamamoto
- , O. Astafiev
- , Y. Nakamura
- , J. S. Tsai
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations