Charge Pump circuit with wide range digital leakage current mismatch compensator

Sangjin Byun, Jae Hoon Shim

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A wide range digital leakage current mismatch compensator for a short-channel charge pump (CP) circuit is presented. Equipped with leakage current generators and leakage current mirrors, the proposed leakage current mismatch compensator can reduce the PMOS and NMOS leakage current mismatch to less than 1/10 times of its initial value for wide range of leakage current mismatches. For simulation, a CP circuit with the proposed leakage current mismatch compensator was designed in a 0.13 μm 1P8M CMOS process.

Original languageEnglish
Pages (from-to)1709-1713
Number of pages5
JournalIEICE Electronics Express
Volume7
Issue number23
DOIs
StatePublished - Dec 2010

Keywords

  • Charge Pump circuit
  • Leakage current
  • Phase locked loop

Fingerprint

Dive into the research topics of 'Charge Pump circuit with wide range digital leakage current mismatch compensator'. Together they form a unique fingerprint.

Cite this