Skip to main navigation Skip to search Skip to main content

Charge traps revisited: from unwanted defects to functional synapses in photosynaptic devices

  • Seungme Kang
  • , Suhyeon Kim
  • , Benoît H. Lessard
  • , Sooji Nam
  • , Hyun Suk Kim
  • , Hocheon Yoo
  • Hanyang University
  • University of Ottawa
  • Electronics and Telecommunications Research Institute

Research output: Contribution to journal › Review article › peer-review

5 Scopus citations

Abstract

Charge trap sites have often been considered defects that induce bias stress, reduce stability, and compromise device reliability. In an out-of-the-box perspective, recent work shows that these sites can also act as useful elements that store charge, tune responses, and mimic biological learning. While past research focused on suppressing or eliminating traps, a growing body of studies now takes the opposite view and explores their deliberate use for synaptic functions. This new direction shifts charge traps from unwanted sites to functional components in memory, synaptic, and optoelectronic devices. Studies now demonstrate trap-based weight storage, light-driven plasticity, and hybrid electro-photonic learning. This review summarizes progress in using interface traps for adaptive and multifunctional electronics. We compare device designs that exploit trap dynamics and highlight their impact on neuromorphic and optoelectronic systems. Key challenges include reproducibility, stability, and integration at large scale. This review offers a timely perspective on exploiting charge traps, with an emphasis on their emerging roles in next-generation neuromorphic and optoelectronic technologies.

Original languageEnglish
Pages (from-to)1192-1214
Number of pages23
JournalNanoscale Horizons
Volume11
Issue number5
DOIs
StatePublished - 1 May 2026

Fingerprint

Dive into the research topics of 'Charge traps revisited: from unwanted defects to functional synapses in photosynaptic devices'. Together they form a unique fingerprint.

Cite this