Correlation between pit formation and phase separation in thick InGaN film on a Si substrate
- Hyeonseok Woo
- , Yongcheol Jo
- , Jongmin Kim
- , Sangeun Cho
- , Cheong Hyun Roh
- , Jun Ho Lee
- , Hyungsang Kim
- , Cheol Koo Hahn
- , Hyunsik Im
- Dongguk University
- Korea Electronics Technology Institute
Research output: Contribution to journal › Article › peer-review
9
Scopus
citations