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Cu4SnS4 thin films fabricated by sulfurizing thermally evaporated Cu/Sn/Cu metal layers

  • U. Chalapathi
  • , Y. B.Kishore Kumar
  • , Nandarapu Purushotham Reddy
  • , Salh Alhammadi
  • , Radhalayam Dhanalakshmi
  • , Golkonda Srinivas Reddy
  • , Adel El-marghany
  • , Krithikaa Mohanarangam
  • , Sambasivam Sangaraju
  • , Vasudeva Reddy Minnam Reddy
  • , Si Hyun Park
  • Mohan Babu University
  • Yeungnam University
  • Universidad de Santiago de Chile
  • Mahatma Gandhi Institute of Technology, Hyderabad
  • King Saud University
  • Symbiosis International University
  • United Arab Emirates University
  • Saveetha Institute of Medical and Technical Sciences (Deemed to be University)

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Cu4SnS4 thin films show potential for photovoltaic applications due to their direct bandgap and high absorption coefficient. This study explores a two-step process for fabricating these films through thermal evaporation followed by sulfurization. Cu/Sn/Cu layers are deposited on Mo-coated glass substrates, and then sulfurized in a furnace at 550 °C for 10 to 60 min. Films sulfurized for 10 and 30 min exhibited large grain sizes, a highly crystalline structure, and uniform surface morphology, with bandgaps between 1.05–1.1 eV and electrical resistivity between 0.87 and 0.65 Ω cm, making them suitable for solar cells. However, sulfurization for 60 min caused a reduction in thickness and pinhole formation due to material loss. This method shows promise for producing high-quality Cu4SnS4 films for thin-film solar cells.

Original languageEnglish
Article number416876
JournalPhysica B: Condensed Matter
Volume699
DOIs
StatePublished - 15 Feb 2025

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • Bandgap
  • CusnS thin films
  • Electrical resistivity
  • Evaporation
  • Sulfurization
  • XRD

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