Defect analysis and performance evaluation of p-type epitaxial GaAs layer on Ge substrate for GaAs/Ge based advanced device

Goutam Kumar Dalapati, Vignesh Suresh, Sandipan Chakraborty, Chandreswar Mahata, Yi Ren, Thirumaleshawara Bhat, Sudhiranjan Tripathy, Taeyoon Lee, Lakshmi Kanta Bera, Dongzhi Chi

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

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