Defect analysis and performance evaluation of p-type epitaxial GaAs layer on Ge substrate for GaAs/Ge based advanced device
- Goutam Kumar Dalapati
- , Vignesh Suresh
- , Sandipan Chakraborty
- , Chandreswar Mahata
- , Yi Ren
- , Thirumaleshawara Bhat
- , Sudhiranjan Tripathy
- , Taeyoon Lee
- , Lakshmi Kanta Bera
- , Dongzhi Chi
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations