Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement
- Sung Heo
- , Jae Gwan Chung
- , Hyung Ik Lee
- , Junho Lee
- , Jong Bong Park
- , Eunae Cho
- , Ki Hong Kim
- , Seong Heon Kim
- , Gyeong Su Park
- , Dongho Lee
- , Jaehan Lee
- , Junggyu Nam
- , Jung Yup Yang
- , Dongwha Lee
- , Hoon Young Cho
- , Hee Jae Kang
- , Pyung Ho Choi
- , Byoung Deog Choi
- Samsung
- Sungkyunkwan University
- Kunsan National University
- Dongguk University
- Chungbuk National University
Research output: Contribution to journal › Article › peer-review
28
Scopus
citations