Design of a CMOS image sensor with a 10-bit two-step single-slope A/D converter and a hybrid correlated double sampling

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Abstract

In this paper, a low-noise CMOS Image Sensor (CIS) based on a 10-bit two-step Single Slope A/D Converter (SS-ADC) with Hybrid CDS is proposed. In order to reduce the pixel noise, a Hybrid Correlated Double Sampling (H-CDS) is discussed. With this technique, Column Fixed Pattern Noise (CFPN) is drastically reduced by about 55% or more, compared to that of analog CDS only. Furthermore, to overcome low conversion speed of SS-ADC , two-step SS-ADC is proposed. The conversion speed of proposed two-step SS-ADC is 5us, while that of the conventional SS-ADC is about 40us at 25MHz reference clock. The proposed CIS has been fabricated with 0.13um 1-poly 4-metal CIS process, and it has a QVGA (320x240) resolution. The fabricated chip size is 5mm x 3mm, and the power consumption is about 35mW at 3.3V supply voltage. The measured CFPN is 0.8LSB, and the frame rate is 220 frames/s.

Original languageEnglish
Title of host publicationConference Proceedings - 10th Conference on Ph. D. Research in Microelectronics and Electronics, PRIME 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479949946
StatePublished - 2014
Event10th Conference on Ph. D. Research in Microelectronics and Electronics, PRIME 2014 - Grenoble, France
Duration: 29 Jun 20143 Jul 2014

Publication series

NameConference Proceedings - 10th Conference on Ph. D. Research in Microelectronics and Electronics, PRIME 2014

Conference

Conference10th Conference on Ph. D. Research in Microelectronics and Electronics, PRIME 2014
Country/TerritoryFrance
CityGrenoble
Period29/06/143/07/14

Keywords

  • Digital CDS
  • Hybrid CDS
  • Hybrid correlated double sampling
  • SS-ADC
  • Two-step single slope ADC

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