Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition

Hohyeon Lee; Soo Youn Kim; Minkyu Song

doi:10.1109/InCIT56086.2022.10067345

Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition

Hohyeon Lee, Soo Youn Kim, Minkyu Song

Division of System Semiconductor

Dongguk University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Normally, a pattern recognition has been studied in the field of digital signal processing with digital codes. Even though it has very accurate results, it needs a lot of power consumption, very long operating time, and huge hardware bundles. In this paper, an edge detected CMOS image sensor for an intelligent pattern recognition is proposed. Further, an efficient edge detection algorithm is also described. With the new techniques, a low power and high speed pattern recognition is available in the field of CMOS image sensor. The image sensor is composed of photodiodes, a two-step single-slope 8-bit analog-to-digital converter, static random memories, and etc. The testing sensor has been implemented with an 180nm technology. It has a very excellent measured results, compared to other published chips.

Original language	English
Title of host publication	6th International Conference on Information Technology, InCIT 2022
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	92-95
Number of pages	4
ISBN (Electronic)	9781665489126
DOIs	https://doi.org/10.1109/InCIT56086.2022.10067345
State	Published - 2022
Event	6th International Conference on Information Technology, InCIT 2022 - Nonthaburi, Thailand Duration: 10 Nov 2022 → 11 Nov 2022

Publication series

Name	6th International Conference on Information Technology, InCIT 2022

Conference

Conference	6th International Conference on Information Technology, InCIT 2022
Country/Territory	Thailand
City	Nonthaburi
Period	10/11/22 → 11/11/22

Keywords

configurable ADC
digital signal processing
edge detected CMOS image sensor
intelligent pattern recognition
two-step single-slope analog-to-digital converter

Access to Document

10.1109/InCIT56086.2022.10067345

Cite this

Lee, H., Kim, S. Y., & Song, M. (2022). Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition. In 6th International Conference on Information Technology, InCIT 2022 (pp. 92-95). (6th International Conference on Information Technology, InCIT 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/InCIT56086.2022.10067345

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title = "Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition",

abstract = "Normally, a pattern recognition has been studied in the field of digital signal processing with digital codes. Even though it has very accurate results, it needs a lot of power consumption, very long operating time, and huge hardware bundles. In this paper, an edge detected CMOS image sensor for an intelligent pattern recognition is proposed. Further, an efficient edge detection algorithm is also described. With the new techniques, a low power and high speed pattern recognition is available in the field of CMOS image sensor. The image sensor is composed of photodiodes, a two-step single-slope 8-bit analog-to-digital converter, static random memories, and etc. The testing sensor has been implemented with an 180nm technology. It has a very excellent measured results, compared to other published chips.",

keywords = "configurable ADC, digital signal processing, edge detected CMOS image sensor, intelligent pattern recognition, two-step single-slope analog-to-digital converter",

author = "Hohyeon Lee and Kim, {Soo Youn} and Minkyu Song",

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year = "2022",

doi = "10.1109/InCIT56086.2022.10067345",

language = "English",

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Lee, H, Kim, SY & Song, M 2022, Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition. in 6th International Conference on Information Technology, InCIT 2022. 6th International Conference on Information Technology, InCIT 2022, Institute of Electrical and Electronics Engineers Inc., pp. 92-95, 6th International Conference on Information Technology, InCIT 2022, Nonthaburi, Thailand, 10/11/22. https://doi.org/10.1109/InCIT56086.2022.10067345

Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition. / Lee, Hohyeon; Kim, Soo Youn ; Song, Minkyu.
6th International Conference on Information Technology, InCIT 2022. Institute of Electrical and Electronics Engineers Inc., 2022. p. 92-95 (6th International Conference on Information Technology, InCIT 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - Normally, a pattern recognition has been studied in the field of digital signal processing with digital codes. Even though it has very accurate results, it needs a lot of power consumption, very long operating time, and huge hardware bundles. In this paper, an edge detected CMOS image sensor for an intelligent pattern recognition is proposed. Further, an efficient edge detection algorithm is also described. With the new techniques, a low power and high speed pattern recognition is available in the field of CMOS image sensor. The image sensor is composed of photodiodes, a two-step single-slope 8-bit analog-to-digital converter, static random memories, and etc. The testing sensor has been implemented with an 180nm technology. It has a very excellent measured results, compared to other published chips.

AB - Normally, a pattern recognition has been studied in the field of digital signal processing with digital codes. Even though it has very accurate results, it needs a lot of power consumption, very long operating time, and huge hardware bundles. In this paper, an edge detected CMOS image sensor for an intelligent pattern recognition is proposed. Further, an efficient edge detection algorithm is also described. With the new techniques, a low power and high speed pattern recognition is available in the field of CMOS image sensor. The image sensor is composed of photodiodes, a two-step single-slope 8-bit analog-to-digital converter, static random memories, and etc. The testing sensor has been implemented with an 180nm technology. It has a very excellent measured results, compared to other published chips.

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Design of an Edge Detected CMOS Image Sensor for an Intelligent Pattern Recognition

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