Direct observation of sub-threshold field emission from silicon nanomembranes

Hua Qin; Renbing Tan; Jonghoo Park; Hyun Seok Kim; Robert H. Blick

doi:10.1063/1.3597782

Direct observation of sub-threshold field emission from silicon nanomembranes

Hua Qin, Renbing Tan, Jonghoo Park, Hyun Seok Kim, Robert H. Blick

Department of Electronics & Electrical Engineering

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Excited by an energetic electron beam, field enhanced electron emission from a silicon nanomembrane is examined by using a local current probe. The experiments reveal clear transitions from conventional secondary electron emission (SEE) to sub-threshold field electron emission (SFE) and then to conventional field electron emission (FEE). An electron yield of more than 10⁴ is obtained and a model of sub-threshold emission is verified. Ultra sensitive charge/particle detectors could be realized by implementing sub-threshold field emission in nano scale structures, where electron excitations occur within the screen depth of surface electric field.

Original language	English
Article number	124504
Journal	Journal of Applied Physics
Volume	109
Issue number	12
DOIs	https://doi.org/10.1063/1.3597782
State	Published - 15 Jun 2011

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abstract = "Excited by an energetic electron beam, field enhanced electron emission from a silicon nanomembrane is examined by using a local current probe. The experiments reveal clear transitions from conventional secondary electron emission (SEE) to sub-threshold field electron emission (SFE) and then to conventional field electron emission (FEE). An electron yield of more than 104 is obtained and a model of sub-threshold emission is verified. Ultra sensitive charge/particle detectors could be realized by implementing sub-threshold field emission in nano scale structures, where electron excitations occur within the screen depth of surface electric field.",

author = "Hua Qin and Renbing Tan and Jonghoo Park and Kim, {Hyun Seok} and Blick, {Robert H.}",

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AU - Qin, Hua

AU - Tan, Renbing

AU - Park, Jonghoo

AU - Kim, Hyun Seok

AU - Blick, Robert H.

PY - 2011/6/15

Y1 - 2011/6/15

N2 - Excited by an energetic electron beam, field enhanced electron emission from a silicon nanomembrane is examined by using a local current probe. The experiments reveal clear transitions from conventional secondary electron emission (SEE) to sub-threshold field electron emission (SFE) and then to conventional field electron emission (FEE). An electron yield of more than 104 is obtained and a model of sub-threshold emission is verified. Ultra sensitive charge/particle detectors could be realized by implementing sub-threshold field emission in nano scale structures, where electron excitations occur within the screen depth of surface electric field.

AB - Excited by an energetic electron beam, field enhanced electron emission from a silicon nanomembrane is examined by using a local current probe. The experiments reveal clear transitions from conventional secondary electron emission (SEE) to sub-threshold field electron emission (SFE) and then to conventional field electron emission (FEE). An electron yield of more than 104 is obtained and a model of sub-threshold emission is verified. Ultra sensitive charge/particle detectors could be realized by implementing sub-threshold field emission in nano scale structures, where electron excitations occur within the screen depth of surface electric field.

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

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Direct observation of sub-threshold field emission from silicon nanomembranes

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