Dual gate-recess structure of metamorphic high-electron-mobility transistors for enhancing fmax

  • Jung Hun Oh
  • , Min Han
  • , Sung Woon Moon
  • , Seokhun Lee
  • , In Seok Hwang
  • , Sam Dong Kim

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Dual gate-recess structure of metamorphic high-electron-mobility transistors for enhancing fmax'. Together they form a unique fingerprint.
Sort by

Earth and Planetary Sciences

Engineering

Immunology and Microbiology

Biochemistry, Genetics and Molecular Biology