Effect of direct current sputtering power on the behavior of amorphous indium-gallium-zinc-oxide thin-film transistors under negative bias illumination stress: A combination of experimental analyses and device simulation
- Jun Tae Jang
- , Jozeph Park
- , Byung Du Ahn
- , Dong Myong Kim
- , Sung Jin Choi
- , Hyun Suk Kim
- , Dae Hwan Kim
- Kookmin University
- Korea Advanced Institute of Science and Technology
- Yonsei University
Research output: Contribution to journal › Article › peer-review