Effect of Mn doping on the chemical synthesis of interconnected nanoflakes-like CoS thin films for high performance supercapacitor applications

S. K. Shinde, M. B. Jalak, S. Y. Kim, H. M. Yadav, G. S. Ghodake, A. A. Kadam, D. Y. Kim

Research output: Contribution to journalArticlepeer-review

41 Scopus citations

Abstract

Herein, supercapacitor developed using Mn-doped CoS thin films (1–5% Mn) were prepared using the successive ionic layer adsorption and reaction (SILAR) method. The effect of the Mn-doped CoS thin films on the structural, morphological, and supercapacitor properties were studied using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), and electrochemical evaluation. Doping up to 3% Mn lead to improvements in peak intensity. Also, the morphological results indicated that doping of Mn affected the CoS nanostructures. The 3% Mn-doped CoS electrodes had an interconnected nanoflakes-like nanostructure, with a high porosity compared to the other electrodes. XPS data strongly supported the XRD results. The Mn-doped CoS electrodes showed a higher capacitance (621 F g−1) than the other electrodes, and electrochemical impedance spectroscopy indicated that the 3% Mn-doped CoS electrode was highly conductive. The characteristics of the 3% Mn-doped CoS electrode proved its applicability in supercapacitors.

Original languageEnglish
Pages (from-to)23102-23108
Number of pages7
JournalCeramics International
Volume44
Issue number18
DOIs
StatePublished - 15 Dec 2018

Keywords

  • CoS thin films
  • Doping
  • Electrochemical testing
  • Interconnected nanoflakes
  • XRD

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