Effects of Ti Doping on the Electrical Properties and Gate-Bias Stability of Amorphous Zinc-Tin-Oxide Thin-Film Transistors
- Sunghyun Park
- , Boyeon Park
- , Seoung Pil Jeon
- , Youngjin Kang
- , Jaehyun Kim
- , Sung Kyu Park
- , Yong Hoon Kim
- Sungkyunkwan University
- Samsung
- Chung-Ang University
Research output: Contribution to journal › Article › peer-review
16
Scopus
citations