TY - JOUR
T1 - Electrochemical and Physical Properties of Electroplated CuO thin films
AU - Dhanasekaran, V.
AU - Mahalingam, T.
PY - 2013/1
Y1 - 2013/1
N2 - Cupric oxide thin films have been prepared on ITO glass substrates from an aqueous electrolytic bath containing CuSO4 and tartaric acid. Growth mechanism has been analyzed using cyclic voltammetry. The role of pH on the structural, morphological, compositional, electrical and optical properties of CuO films is investigated. The structural studies revealed that the deposited films are polycrystalline in nature with a cubic structure. The preferential orientation of CuO thin films is found to be along (111) plane. X-ray line profile analysis has been carried out to determine the microstructural parameters of CuO thin films. The pyramid shaped grains are observed from SEM and AFM images. The optical band gap energy and electrical activation energy is found to be 1.45 and 0.37 eV, respectively. Also, the optical constants of CuO thin films such as refractive index (n), complex dielectric constant (ε) extinction coefficient (k) and optical conductivity (σ) are evaluated.
AB - Cupric oxide thin films have been prepared on ITO glass substrates from an aqueous electrolytic bath containing CuSO4 and tartaric acid. Growth mechanism has been analyzed using cyclic voltammetry. The role of pH on the structural, morphological, compositional, electrical and optical properties of CuO films is investigated. The structural studies revealed that the deposited films are polycrystalline in nature with a cubic structure. The preferential orientation of CuO thin films is found to be along (111) plane. X-ray line profile analysis has been carried out to determine the microstructural parameters of CuO thin films. The pyramid shaped grains are observed from SEM and AFM images. The optical band gap energy and electrical activation energy is found to be 1.45 and 0.37 eV, respectively. Also, the optical constants of CuO thin films such as refractive index (n), complex dielectric constant (ε) extinction coefficient (k) and optical conductivity (σ) are evaluated.
KW - Electrochemical preparation
KW - Materials characterization
KW - Thin films
KW - XRD
UR - http://www.scopus.com/inward/record.url?scp=84876231990&partnerID=8YFLogxK
U2 - 10.1166/jnn.2013.6709
DO - 10.1166/jnn.2013.6709
M3 - Article
C2 - 23646724
AN - SCOPUS:84876231990
SN - 1533-4880
VL - 13
SP - 250
EP - 259
JO - Journal of Nanoscience and Nanotechnology
JF - Journal of Nanoscience and Nanotechnology
IS - 1
ER -