Electrochemical preparation and characterization of cupric oxide thin films

V. Dhanasekaran, T. Mahalingam, R. Chandramohan, J. P. Chu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The aim of the present study is to investigate the role of pH on the structural, morphological and optical properties of the CuO films. The structural studies revealed that the deposited films are polycrystalline in nature with a cubic structure. The preferential orientation of CuO thin films is found to be along (111) plane. The microstuctural properties such as lattice parameters, crystallite size (D), dislocation density (δ), and microstrain (ε) were calculated. The estimated microstructural parameters revealed that the crystallite size decreases whereas the microstrain increases with increasing solution pH. The surface morphology and elemental analyzes of the films were studied using scanning electron microscopy and energy dispersive analysis by X-rays (EDX), respectively. The topography and surface roughness of the film were studied by atomic force microscopy. The indirect band gap of 1.45 eV is estimated from optical studies and the results are discussed.

Original languageEnglish
Title of host publicationElectrodeposition for Energy Applications 2
Pages53-60
Number of pages8
Edition21
DOIs
StatePublished - 2011
EventElectrodeposition for Energy Applications 2 - 219th ECS Meeting - Montreal, QC, Canada
Duration: 1 May 20116 May 2011

Publication series

NameECS Transactions
Number21
Volume35
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceElectrodeposition for Energy Applications 2 - 219th ECS Meeting
Country/TerritoryCanada
CityMontreal, QC
Period1/05/116/05/11

Fingerprint

Dive into the research topics of 'Electrochemical preparation and characterization of cupric oxide thin films'. Together they form a unique fingerprint.

Cite this