TY - JOUR
T1 - Electronic synaptic plasticity and analog switching characteristics in Pt/TiOx/AlOx/AlTaON/TaN multilayer RRAM for artificial synapses
AU - Ismail, Muhammad
AU - Mahata, Chandreswar
AU - Kim, Sungjun
N1 - Publisher Copyright:
© 2022 Elsevier B.V.
PY - 2022/10/15
Y1 - 2022/10/15
N2 - In this work, electronic synaptic plasticity and analog bipolar switching behavior by using a Pt/TiOx/AlOx/AlTaON/TaN multilayer resistive random-access memory (RRAM) device were examined. By using high-resolution transmission electron microscopy (HRTEM), the oxidation–reduction reaction occurs between the Ti buffer layer and the high-k Al2O3 layer at the top interface, and the high-k Al2O3 layer and the TaN bottom electrode at the bottom interface, resulting in the formation of the Pt/TiOx/AlOx/AlTaON/TaN multilayer RRAM structure. According to X-ray photoelectron spectroscopy (XPS) studies, different proportions of oxygen vacancies in TiOx/AlOx/AlTaON multilayer film play a key role in increasing RS properties uniformity. This multilayer structure-based RRAM device exhibits a stable RS behavior with a very large on/off resistance window (∼104), excellent durability (500 DC endurance cycles), and 104 s retention period with virtuous uniformity during the cycling operation. Furthermore, the device mean value (μ) set-and reset-voltage is −2.82 V, and +1.5 V, resulting in a low-operating voltage that is beneficial for neuromorphic systems. Besides, by adjusting the reset voltage, the device achieved a progressive transition from the low resistance state (LRS) to the high resistance state (HRS). To develop the artificial neural networks, basic biological properties such as potentiation, depression, and paired-pulse facilitation were efficiently mimicked. Ohmic conduction in the LRS and Schottky emission in the HRS are the two types of current transport conduction mechanisms. The analog bipolar switching behavior is governed by the redox reaction, which promotes the formation and rupture of oxygen vacancy-based conical shape conductive filaments. These findings show that multilayer RRAM devices have the potential to be used for future information storage and neuromorphic computing of artificial synapses.
AB - In this work, electronic synaptic plasticity and analog bipolar switching behavior by using a Pt/TiOx/AlOx/AlTaON/TaN multilayer resistive random-access memory (RRAM) device were examined. By using high-resolution transmission electron microscopy (HRTEM), the oxidation–reduction reaction occurs between the Ti buffer layer and the high-k Al2O3 layer at the top interface, and the high-k Al2O3 layer and the TaN bottom electrode at the bottom interface, resulting in the formation of the Pt/TiOx/AlOx/AlTaON/TaN multilayer RRAM structure. According to X-ray photoelectron spectroscopy (XPS) studies, different proportions of oxygen vacancies in TiOx/AlOx/AlTaON multilayer film play a key role in increasing RS properties uniformity. This multilayer structure-based RRAM device exhibits a stable RS behavior with a very large on/off resistance window (∼104), excellent durability (500 DC endurance cycles), and 104 s retention period with virtuous uniformity during the cycling operation. Furthermore, the device mean value (μ) set-and reset-voltage is −2.82 V, and +1.5 V, resulting in a low-operating voltage that is beneficial for neuromorphic systems. Besides, by adjusting the reset voltage, the device achieved a progressive transition from the low resistance state (LRS) to the high resistance state (HRS). To develop the artificial neural networks, basic biological properties such as potentiation, depression, and paired-pulse facilitation were efficiently mimicked. Ohmic conduction in the LRS and Schottky emission in the HRS are the two types of current transport conduction mechanisms. The analog bipolar switching behavior is governed by the redox reaction, which promotes the formation and rupture of oxygen vacancy-based conical shape conductive filaments. These findings show that multilayer RRAM devices have the potential to be used for future information storage and neuromorphic computing of artificial synapses.
KW - Analog switching
KW - Electronic synapse
KW - Neuromorphic computing
KW - Schottky emission
KW - Ti buffer layer
UR - http://www.scopus.com/inward/record.url?scp=85131726863&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2022.153906
DO - 10.1016/j.apsusc.2022.153906
M3 - Article
AN - SCOPUS:85131726863
SN - 0169-4332
VL - 599
JO - Applied Surface Science
JF - Applied Surface Science
M1 - 153906
ER -