Electrosynthesis and studies on Zn1-xHgxTe thin films

T. Mahalingam; A. Kathalingam; S. Velumani; Soonil Lee; Hosun Moon; Yong Deak Kim

Electrosynthesis and studies on Zn_1-xHg_xTe thin films

T. Mahalingam, A. Kathalingam, S. Velumani, Soonil Lee, Hosun Moon, Yong Deak Kim

Millimeterwave Innovation Technology Research Center

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

The electrodeposition and characterization of Zn_1-xHg _xTe (ZMT) thin films is reported in this work. The films were deposited onto SnO₂ coated glass substrates from an aqueous solution bath of ZnSO₄, HgCl₂ and TeO₂ at bath temperatures between 30°C and 80°C. Well adherent Zn _1-xHg_xTe films with compositions varying between x = 0 to x = 0.4 were obtained. The effect of growth parameters such as deposition potential, concentration of electrolyte bath, pH and temperature on the properties of the film was studied. X-ray diffraction technique was used to determine composition, crystalline structure and grain size of the films. The films exhibited zinc blend structure with predominant (111) orientation. Optical and electrical studies were also studied and the results are discussed.

Original language	English
Pages (from-to)	21-25
Number of pages	5
Journal	Journal of New Materials for Electrochemical Systems
Volume	10
Issue number	1
State	Published - Jan 2007

Keywords

Electrodeposition
Ternary alloy
Thin films
Zinc mercury telluride

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This output contributes to the following UN Sustainable Development Goals (SDGs)

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title = "Electrosynthesis and studies on Zn1-xHgxTe thin films",

abstract = "The electrodeposition and characterization of Zn1-xHg xTe (ZMT) thin films is reported in this work. The films were deposited onto SnO2 coated glass substrates from an aqueous solution bath of ZnSO4, HgCl2 and TeO2 at bath temperatures between 30°C and 80°C. Well adherent Zn 1-xHgxTe films with compositions varying between x = 0 to x = 0.4 were obtained. The effect of growth parameters such as deposition potential, concentration of electrolyte bath, pH and temperature on the properties of the film was studied. X-ray diffraction technique was used to determine composition, crystalline structure and grain size of the films. The films exhibited zinc blend structure with predominant (111) orientation. Optical and electrical studies were also studied and the results are discussed.",

keywords = "Electrodeposition, Ternary alloy, Thin films, Zinc mercury telluride",

author = "T. Mahalingam and A. Kathalingam and S. Velumani and Soonil Lee and Hosun Moon and Kim, {Yong Deak}",

year = "2007",

month = jan,

language = "English",

volume = "10",

pages = "21--25",

journal = "Journal of New Materials for Electrochemical Systems",

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TY - JOUR

T1 - Electrosynthesis and studies on Zn1-xHgxTe thin films

AU - Mahalingam, T.

AU - Kathalingam, A.

AU - Velumani, S.

AU - Lee, Soonil

AU - Moon, Hosun

AU - Kim, Yong Deak

PY - 2007/1

Y1 - 2007/1

N2 - The electrodeposition and characterization of Zn1-xHg xTe (ZMT) thin films is reported in this work. The films were deposited onto SnO2 coated glass substrates from an aqueous solution bath of ZnSO4, HgCl2 and TeO2 at bath temperatures between 30°C and 80°C. Well adherent Zn 1-xHgxTe films with compositions varying between x = 0 to x = 0.4 were obtained. The effect of growth parameters such as deposition potential, concentration of electrolyte bath, pH and temperature on the properties of the film was studied. X-ray diffraction technique was used to determine composition, crystalline structure and grain size of the films. The films exhibited zinc blend structure with predominant (111) orientation. Optical and electrical studies were also studied and the results are discussed.

AB - The electrodeposition and characterization of Zn1-xHg xTe (ZMT) thin films is reported in this work. The films were deposited onto SnO2 coated glass substrates from an aqueous solution bath of ZnSO4, HgCl2 and TeO2 at bath temperatures between 30°C and 80°C. Well adherent Zn 1-xHgxTe films with compositions varying between x = 0 to x = 0.4 were obtained. The effect of growth parameters such as deposition potential, concentration of electrolyte bath, pH and temperature on the properties of the film was studied. X-ray diffraction technique was used to determine composition, crystalline structure and grain size of the films. The films exhibited zinc blend structure with predominant (111) orientation. Optical and electrical studies were also studied and the results are discussed.

KW - Electrodeposition

KW - Ternary alloy

KW - Thin films

KW - Zinc mercury telluride

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M3 - Article

AN - SCOPUS:34247191517

SN - 1480-2422

VL - 10

SP - 21

EP - 25

JO - Journal of New Materials for Electrochemical Systems

JF - Journal of New Materials for Electrochemical Systems

IS - 1

ER -

Electrosynthesis and studies on Zn_1-xHg_xTe thin films

Abstract

Keywords

UN SDGs

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