Abstract
The p-type InP:Be/Mn/InMnP:Be triple epilayers were prepared using MBE to increase Tc (>300 K) by preventing MnO2. After milling 1-3 nm of epilayers thickness from the top surface, the transmission electron microscopy (TEM) and X-ray diffraction (XRD) revealed no MnO2 and precipitates, and TEM and XRD results coincide with results of ferromagnetism. The enhanced ferromagnetic transition at >300 K corresponds to InMnP:Be. The increased ferromagnetic coupling without MnO2 is considered to originate from the increased p-d hybridation. These results demonstrate that InP-based ferromagnetic semiconductor layers having enhanced ferromagnetism can be formed by above process.
| Original language | English |
|---|---|
| Pages (from-to) | 558-562 |
| Number of pages | 5 |
| Journal | Current Applied Physics |
| Volume | 14 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2014 |
Keywords
- Increased T
- MBE
- p-type InP:Be/Mn/InP:Be triple layers
Fingerprint
Dive into the research topics of 'Enhanced ferromagnetism by preventing antiferromagnetic MnO2 in InP:Be/Mn/InP:Be triple layers fabricated using molecular beam epitaxy'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver