TY - JOUR
T1 - Enhanced stability of all solution-processed organic thin-film transistors using highly conductive modified polymer electrodes
AU - Han, Jeong In
AU - Kim, Yong Hoon
AU - Park, Sung Kyu
PY - 2012/9
Y1 - 2012/9
N2 - Enhanced stability of all solution-processed organic thin-film transistors (OTFTs) has been achieved by replacing metallic electrodes with glycerolmodified poly(3,4-ethylene dioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) polymer electrodes. The modified PEDOT:PSS showed a substantially low electrical resistivity of 6:4 × 10 -3 Ωcm with improved environmental stability and water-resistant characteristics, which are crucial for highly reliable applications. Additionally, the modified PEDOT:PSS electrodes were highly stable under intense mechanical stress, allowing their application to flexible electronics. Particularly, all solution-processed flexible and transparent OTFTs with the modified PEDOT:PSS electrodes showed a field-effect mobility decrease of only 2.7% after a tensile mode mechanical fatigue test, while OTFTs with metallic electrodes showed a mobility decrease of 56.6% under identical test conditions.
AB - Enhanced stability of all solution-processed organic thin-film transistors (OTFTs) has been achieved by replacing metallic electrodes with glycerolmodified poly(3,4-ethylene dioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) polymer electrodes. The modified PEDOT:PSS showed a substantially low electrical resistivity of 6:4 × 10 -3 Ωcm with improved environmental stability and water-resistant characteristics, which are crucial for highly reliable applications. Additionally, the modified PEDOT:PSS electrodes were highly stable under intense mechanical stress, allowing their application to flexible electronics. Particularly, all solution-processed flexible and transparent OTFTs with the modified PEDOT:PSS electrodes showed a field-effect mobility decrease of only 2.7% after a tensile mode mechanical fatigue test, while OTFTs with metallic electrodes showed a mobility decrease of 56.6% under identical test conditions.
UR - http://www.scopus.com/inward/record.url?scp=84865854087&partnerID=8YFLogxK
U2 - 10.1143/JJAP.51.091602
DO - 10.1143/JJAP.51.091602
M3 - Article
AN - SCOPUS:84865854087
SN - 0021-4922
VL - 51
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
IS - 9
M1 - 091602
ER -