Erratum: Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

Sung Jin Jo; Chang Su Kim; Seung Yoon Ryu; Jong Bok Kim; Joo Hyon Noh; Se Jong Lee; Hong Koo Baik

doi:10.1143/JJAP.47.404

Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

Sung Jin Jo
, Chang Su Kim
, Seung Yoon Ryu
, Jong Bok Kim
, Joo Hyon Noh
, Se Jong Lee
, Hong Koo Baik

Department of Physics

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	404
Number of pages	1
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	47
Issue number	1
DOIs	https://doi.org/10.1143/JJAP.47.404
State	Published - 18 Jan 2008

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10.1143/JJAP.47.404

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Jo, S. J., Kim, C. S., Ryu, S. Y., Kim, J. B., Noh, J. H., Lee, S. J., & Baik, H. K. (2008). Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814)). Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 47(1), 404. https://doi.org/10.1143/JJAP.47.404

Jo, Sung Jin ; Kim, Chang Su ; Ryu, Seung Yoon et al. / Erratum : Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814)). In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 2008 ; Vol. 47, No. 1. pp. 404.

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title = "Erratum: Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))",

author = "Jo, \{Sung Jin\} and Kim, \{Chang Su\} and Ryu, \{Seung Yoon\} and Kim, \{Jong Bok\} and Noh, \{Joo Hyon\} and Lee, \{Se Jong\} and Baik, \{Hong Koo\}",

year = "2008",

month = jan,

day = "18",

doi = "10.1143/JJAP.47.404",

language = "English",

volume = "47",

pages = "404",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

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Jo, SJ, Kim, CS, Ryu, SY, Kim, JB, Noh, JH, Lee, SJ & Baik, HK 2008, 'Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 47, no. 1, pp. 404. https://doi.org/10.1143/JJAP.47.404

Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814)). / Jo, Sung Jin; Kim, Chang Su; Ryu, Seung Yoon et al.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 47, No. 1, 18.01.2008, p. 404.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Erratum

T2 - Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

AU - Jo, Sung Jin

AU - Kim, Chang Su

AU - Ryu, Seung Yoon

AU - Kim, Jong Bok

AU - Noh, Joo Hyon

AU - Lee, Se Jong

AU - Baik, Hong Koo

PY - 2008/1/18

Y1 - 2008/1/18

UR - https://www.scopus.com/pages/publications/38549167118

U2 - 10.1143/JJAP.47.404

DO - 10.1143/JJAP.47.404

M3 - Comment/debate

AN - SCOPUS:38549167118

SN - 0021-4922

VL - 47

SP - 404

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 1

ER -

Jo SJ, Kim CS, Ryu SY, Kim JB, Noh JH, Lee SJ et al. Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814)). Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 2008 Jan 18;47(1):404. doi: 10.1143/JJAP.47.404

Erratum: Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

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Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))