Failure of the top emission organic light-emitting device with a Ca/Ag semitransparent cathode

D. G. Moon; R. B. Pode; C. J. Lee; J. I. Han

doi:10.1016/j.synthmet.2004.06.002

Failure of the top emission organic light-emitting device with a Ca/Ag semitransparent cathode

D. G. Moon
, R. B. Pode
, C. J. Lee
, J. I. Han

Department of Chemical and Biochemical Engineering

Korea Electronics Technology Institute

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

The influence of vacuum conditions during the deposition of Ca/Ag cathode on the performance of top emission organic light-emitting devices (TEOLEDs) is investigated. The fabricated devices have been characterized by current-voltage (I-V) and electroluminescence (EL) measurements. Low turn-on voltage and high yield of EL are observed if the cathode is deposited in a better background pressure than 2.78 × 10^-6 Torr, whereas the deposition of cathode in a poor back ground pressure (<2.78 × 10^-6 Torr) leads to device failure. It is argued that the partial oxidation of Ca significantly improves the transparency of the Ca/Ag cathode while remaining conducting, whereas the complete oxidation of Ca (formation of Ca-O bonds) results into device failure.

Original language	English
Pages (from-to)	63-68
Number of pages	6
Journal	Synthetic Metals
Volume	146
Issue number	1
DOIs	https://doi.org/10.1016/j.synthmet.2004.06.002
State	Published - 14 Oct 2004

Keywords

Ca oxidation
Ca/Ag semitransparent cathode
Device failure
Top emission organic light-emitting devices (TEOLEDs)
Transmittance

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10.1016/j.synthmet.2004.06.002

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title = "Failure of the top emission organic light-emitting device with a Ca/Ag semitransparent cathode",

abstract = "The influence of vacuum conditions during the deposition of Ca/Ag cathode on the performance of top emission organic light-emitting devices (TEOLEDs) is investigated. The fabricated devices have been characterized by current-voltage (I-V) and electroluminescence (EL) measurements. Low turn-on voltage and high yield of EL are observed if the cathode is deposited in a better background pressure than 2.78 × 10-6 Torr, whereas the deposition of cathode in a poor back ground pressure (<2.78 × 10-6 Torr) leads to device failure. It is argued that the partial oxidation of Ca significantly improves the transparency of the Ca/Ag cathode while remaining conducting, whereas the complete oxidation of Ca (formation of Ca-O bonds) results into device failure.",

keywords = "Ca oxidation, Ca/Ag semitransparent cathode, Device failure, Top emission organic light-emitting devices (TEOLEDs), Transmittance",

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year = "2004",

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doi = "10.1016/j.synthmet.2004.06.002",

language = "English",

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journal = "Synthetic Metals",

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TY - JOUR

T1 - Failure of the top emission organic light-emitting device with a Ca/Ag semitransparent cathode

AU - Moon, D. G.

AU - Pode, R. B.

AU - Lee, C. J.

AU - Han, J. I.

PY - 2004/10/14

Y1 - 2004/10/14

N2 - The influence of vacuum conditions during the deposition of Ca/Ag cathode on the performance of top emission organic light-emitting devices (TEOLEDs) is investigated. The fabricated devices have been characterized by current-voltage (I-V) and electroluminescence (EL) measurements. Low turn-on voltage and high yield of EL are observed if the cathode is deposited in a better background pressure than 2.78 × 10-6 Torr, whereas the deposition of cathode in a poor back ground pressure (<2.78 × 10-6 Torr) leads to device failure. It is argued that the partial oxidation of Ca significantly improves the transparency of the Ca/Ag cathode while remaining conducting, whereas the complete oxidation of Ca (formation of Ca-O bonds) results into device failure.

AB - The influence of vacuum conditions during the deposition of Ca/Ag cathode on the performance of top emission organic light-emitting devices (TEOLEDs) is investigated. The fabricated devices have been characterized by current-voltage (I-V) and electroluminescence (EL) measurements. Low turn-on voltage and high yield of EL are observed if the cathode is deposited in a better background pressure than 2.78 × 10-6 Torr, whereas the deposition of cathode in a poor back ground pressure (<2.78 × 10-6 Torr) leads to device failure. It is argued that the partial oxidation of Ca significantly improves the transparency of the Ca/Ag cathode while remaining conducting, whereas the complete oxidation of Ca (formation of Ca-O bonds) results into device failure.

KW - Ca oxidation

KW - Ca/Ag semitransparent cathode

KW - Device failure

KW - Top emission organic light-emitting devices (TEOLEDs)

KW - Transmittance

UR - https://www.scopus.com/pages/publications/4544287185

U2 - 10.1016/j.synthmet.2004.06.002

DO - 10.1016/j.synthmet.2004.06.002

M3 - Article

AN - SCOPUS:4544287185

SN - 0379-6779

VL - 146

SP - 63

EP - 68

JO - Synthetic Metals

JF - Synthetic Metals

IS - 1

ER -

Failure of the top emission organic light-emitting device with a Ca/Ag semitransparent cathode

Abstract

Keywords

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