Abstract
ZnTiMnO layers grown on Pt (111)/Al2O3 (0001) substrates exhibit lattice displacement-induced ferroelectric features, which arise from a modulation in the lattice translation symmetry and originate from the substitution of Ti and Mn ions at Zn sites in ZnO’s host lattices. After annealing at 900°C, the ZnTiMnO layer shows a clear hysteresis loop, where the maximum polarization is fully saturated within wide electric-field regions. The top-to-bottom Pt/ZnTiMnO/Pt device reveals a polarization-dependent asymmetric hysteresis (i.e., ferroelectric memristive-switching); in addition, the device shows > 60% data-retention per 10 years. These results suggest that ZnTiMnO holds great promise for use in ferroelectric memristive-switching devices.
| Original language | English |
|---|---|
| Pages (from-to) | 869-874 |
| Number of pages | 6 |
| Journal | Journal of the Korean Physical Society |
| Volume | 68 |
| Issue number | 7 |
| DOIs | |
| State | Published - 1 Apr 2016 |
Keywords
- Ferroelectric hysteresis
- Polarization-dependent memristive behavior
- Ti- and Mn-codoped ZnO
Fingerprint
Dive into the research topics of 'Ferroelectric polarization-induced memristive hysteresis behaviors in Ti- and Mn-codoped ZnO'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver