Formation and Characterization of (Zn1-xMnx)O Diluted Magnetic Semiconductors Grown on (0001) Al2O3 Substrates

  • Doo Soo Kim
  • , Sejoon Lee
  • , Cheonki Min
  • , Hwa Mok Kim
  • , Sh U. Yuldashev
  • , Tae Won Kang
  • , Deuk Young Kim
  • , Tae Whan Kim

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

(Zn1-xMnx)O diluted magnetic semiconductors (DMSs) grown on (0001) Al2O3 substrates by radio frequency magnetron sputtering were investigated with the aim of producing a material with a high ferromagnetic transition temperature (Tc). X-ray diffraction, photoluminescence, and Hall-effect measurements showed that the grown (Zn1-xMnx)O thin films were p-type crystalline semiconductors with single phases. Magnetization curve as a function of magnetic field at 5K indicated that ferromagnetism existed in the (Zn 1-xMnx)O thin films, and magnetization curve as a function of temperature showed that the Tc of the (Zn 0.93Mn30.07)O thin film was 70K. These observations can improve the understanding of the increase in Tc for (Zn 1-xMnxO DMSs grown on (0001) Al2O3 substrates.

Original languageEnglish
Pages (from-to)7217-7220
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume42
Issue number12
DOIs
StatePublished - Dec 2003

Keywords

  • (ZnMn)O
  • Diluted magnetic semiconductors
  • Ferromagnetic transition temperature
  • Ferromagnetism
  • Magnetron sputtering

Fingerprint

Dive into the research topics of 'Formation and Characterization of (Zn1-xMnx)O Diluted Magnetic Semiconductors Grown on (0001) Al2O3 Substrates'. Together they form a unique fingerprint.

Cite this