Abstract
Si nanocrystals were formed by using a Au nanoscale island etching mask. A high-resolution transmission electron microscopy image showed that the Si nanocrystals were created on a SiOx layer, and the luminescence peak related to Si nanocrystals was observed in the cathodoluminescence spectrum. Capacitance-voltage measurements demonstrate a metal-insulator-semiconductor behavior with a flatband voltage shift for the Al/ SiO 2/nanocrystalline Si/SiO2/p-Si structures, indicative of the existence of the Si nanocrystals embedded into the SiOx layer. These results indicate that Si nanocrystals embedded into the SiOx layer can be formed by using a Au island etching mask.
Original language | English |
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Pages (from-to) | 193-198 |
Number of pages | 6 |
Journal | Materials Research Bulletin |
Volume | 40 |
Issue number | 1 |
DOIs | |
State | Published - 4 Jan 2005 |
Keywords
- A. Semiconductors
- B. Chemical synthesis
- D. Optical properties