GaN nanorods grown on Si (111) substrates and exciton localization

Young S. Park, Mark J. Holmes, Y. Shon, Im Taek Yoon, Hyunsik Im, Robert A. Taylor

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We have investigated exciton localization in binary GaN nanorods using micro- and time-resolved photoluminescence measurements. The temperature dependence of the photoluminescence has been measured, and several phonon replicas have been observed at the lower energy side of the exciton bound to basal stacking faults (I 1). By analyzing the Huang-Rhys parameters as a function of temperature, deduced from the phonon replica intensities, we have found that the excitons are strongly localized in the lower energy tails. The lifetimes of the I 1 and I 2 transitions were measured to be < 100 ps due to enhanced surface recombination. PACS: 78.47.+p, 78.55.-m, 78.55.Cr, 78.66.-w, 78.66.Fd.

Original languageEnglish
Article number81
Pages (from-to)1-5
Number of pages5
JournalNanoscale Research Letters
Volume6
DOIs
StatePublished - 2011

Fingerprint

Dive into the research topics of 'GaN nanorods grown on Si (111) substrates and exciton localization'. Together they form a unique fingerprint.

Cite this