Gradual resistive switching and synaptic properties of ITO/HfAlO/ITO device embedded with Pt nanoparticles

Hassan Algadi, Chandreswar Mahata, Turki Alsuwian, Muhammad Ismail, Daewoong Kwon, Sungjun Kim

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

ITO/HfAlO/Pt-NP/HfAlO/ITO RRAM device was fabricated with atomic layer deposited Pt-NPs. Controlled filament formation and multilevel conductance was observed due to enhancing local electric field near Pt-NPs. Resistive switching properties with ON/OFF ratio of > 10 and good endurance upto 500 cycles were achieved. Potentiation/depression characteristics were successfully demonstrated by applying increasing positive/negative voltage pulses. Gradual change in conductance was implemented for demonstration of spike-timing-dependent plasticity (STDP) learning which shows that the proposed RRAM device can be the possible candidate for electronic synaptic devices.

Original languageEnglish
Article number130011
JournalMaterials Letters
Volume298
DOIs
StatePublished - 1 Sep 2021

Keywords

  • ALD Pt-nanoparticles
  • Multilevel conductance properties
  • STDP
  • Transparent RRAM

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