Growth of mirror-like Zn1-xMnxO diluted magnetic semiconductor thin films by r.f. magnetron sputtering method

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Abstract

The Zn1-xMnxO thin films were grown on Al 2O3 (0001) substrates by an r.f. magnetron sputtering method. The film grown with employing buffer layer shows mirror-like surface, while the film grown without buffer layer shows the columnar-structured configuration. The mirror-like Zn0.93Mn0.07O thin films have the single crystalline phase with (000l) orientation normal to the substrate surface and show the UV emission originated from the near band-edge-emission for the measurements of x-ray diffraction and photoluminescence, respectively. The mirror-like Zn0.93Mn 0.07O film clearly showed a hysteresis loop, which is obvious evidence of ferromagnetism, and the Curie temperature was determined to be 68 K for the characterization of the temperature-dependent magnetization.

Original languageEnglish
Title of host publicationSemiconductor Spintronics
PublisherMaterials Research Society
Pages49-54
Number of pages6
ISBN (Print)1558997539, 9781558997530
DOIs
StatePublished - 2004
Event2004 MRS Spring Meeting - San Francisco, CA, United States
Duration: 12 Apr 200416 Apr 2004

Publication series

NameMaterials Research Society Symposium Proceedings
Volume825
ISSN (Print)0272-9172

Conference

Conference2004 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period12/04/0416/04/04

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