High-temperature characteristics of 2-D MESFET's
- T. Ytterdal
- , M. Hurt
- , M. Shur
- , H. Park
- , R. Tsai
- , W. C.B. Peatman
- IEEE
- University of Virginia
- Advanced Device Technologies, Inc.
Research output: Contribution to journal › Article › peer-review
6
Scopus
citations