TY - JOUR
T1 - Hydrazine-assisted hydrothermal synthesis of NiTe and NiTe2 nanorods
AU - Kulandaivel, Loganathan
AU - Park, Jeong Won
AU - Sivakumar, Periyasamy
AU - Jung, Hyun
N1 - Publisher Copyright:
© 2023, The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature.
PY - 2023/7
Y1 - 2023/7
N2 - Herein, we report nanostructures of NiTe and NiTe2 nanorods (NRs) with stoichiometric chemical compositions grown in an efficient one-pot hydrothermal approach. In the synthesis, hydrazine hydrate played multiple roles, such as a dissolving agent, reductant, and structure-directing agent. The samples were characterized using various analytical methods, such as X-ray diffraction, high-resolution transmission electron microscopy (HR-TEM), nitrogen adsorption/desorption measurements, energy-dispersive X-ray spectrometer (EDX), field-emission scanning electron microscopy (FE-SEM), X-ray photoelectron spectroscopy (XPS), and UV–Vis diffuse reflectance spectroscopy consequently. Adjustment of the Ni:Te (1:1, 1:2) precursors molar ratio reflected the results as desirable stoichiometric crystal structures of NiTe (hexagonal, P6 3/ mmc ) and NiTe2 (trigonal, P3 ¯ m 1 ); further, the FE-SEM images displayed the evolution of nanorod morphology with an intermediate of tellurium template by the influence of the Kirkendall effect. The TEM pictures are likely to show the formation of two distinguished nanorods with different particle sizes. Both NiTe NRs and NiTe2 NRs were developed along the hexagonal direction; however, NiTe NRs include relatively small particles, and NiTe2 NRs considerably larger ones. The high-resolution XPS spectra revealed the surface structure and chemical composition of the Ni–Te system under Ni 2p and Te 3d spectra with the characteristic peaks of Ni2+, Ni0, Te2−, and Te4+ assigned based on the influence of hydrazine reduction and surface oxidation, respectively. Therefore, the optical band gap value of the prepared NiTe and NiTe2 NRs phases was found to be 3.25 and 3.0 eV, showing the semiconductor properties and potential for a wide range of applications.
AB - Herein, we report nanostructures of NiTe and NiTe2 nanorods (NRs) with stoichiometric chemical compositions grown in an efficient one-pot hydrothermal approach. In the synthesis, hydrazine hydrate played multiple roles, such as a dissolving agent, reductant, and structure-directing agent. The samples were characterized using various analytical methods, such as X-ray diffraction, high-resolution transmission electron microscopy (HR-TEM), nitrogen adsorption/desorption measurements, energy-dispersive X-ray spectrometer (EDX), field-emission scanning electron microscopy (FE-SEM), X-ray photoelectron spectroscopy (XPS), and UV–Vis diffuse reflectance spectroscopy consequently. Adjustment of the Ni:Te (1:1, 1:2) precursors molar ratio reflected the results as desirable stoichiometric crystal structures of NiTe (hexagonal, P6 3/ mmc ) and NiTe2 (trigonal, P3 ¯ m 1 ); further, the FE-SEM images displayed the evolution of nanorod morphology with an intermediate of tellurium template by the influence of the Kirkendall effect. The TEM pictures are likely to show the formation of two distinguished nanorods with different particle sizes. Both NiTe NRs and NiTe2 NRs were developed along the hexagonal direction; however, NiTe NRs include relatively small particles, and NiTe2 NRs considerably larger ones. The high-resolution XPS spectra revealed the surface structure and chemical composition of the Ni–Te system under Ni 2p and Te 3d spectra with the characteristic peaks of Ni2+, Ni0, Te2−, and Te4+ assigned based on the influence of hydrazine reduction and surface oxidation, respectively. Therefore, the optical band gap value of the prepared NiTe and NiTe2 NRs phases was found to be 3.25 and 3.0 eV, showing the semiconductor properties and potential for a wide range of applications.
UR - http://www.scopus.com/inward/record.url?scp=85165364723&partnerID=8YFLogxK
U2 - 10.1007/s10854-023-10977-8
DO - 10.1007/s10854-023-10977-8
M3 - Article
AN - SCOPUS:85165364723
SN - 0957-4522
VL - 34
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 20
M1 - 1557
ER -