@inproceedings{046d93fda17a4a32adef5354dc94b8c8,
title = "Internal photoemission study on reliability of ultra-thin zirconium oxide films on strained-Si",
author = "Bera, {M. K.} and C. Mahata and Maiti, {C. K.}",
year = "2007",
doi = "10.1109/IPFA.2007.4378066",
language = "English",
isbn = "1424410142",
series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",
pages = "100--105",
booktitle = "Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007",
note = "2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits ; Conference date: 11-07-2007 Through 13-07-2007",
}