Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy

Min Hwan Park; Jae Won Jang; Cheol Eui Lee; Cheol Jin Lee

doi:10.1063/1.1851615

Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy

Min Hwan Park, Jae Won Jang, Cheol Eui Lee, Cheol Jin Lee

Division of System Semiconductor

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28 Scopus citations

Abstract

Atomically resolved room temperature scanning tunneling microscopy images of carbon nanotubes were obtained, and actual values of the nanotube dimensions were estimated from a line profile fitting analysis. It was found that the cross sectional deformation induced by the van der Waals forces between the CNTs and the substrate is much smaller in the double-walled carbon nanotubes than in the single-walled nanotubes.

Original language	English
Article number	023110
Pages (from-to)	023110-1-023110-3
Journal	Applied Physics Letters
Volume	86
Issue number	2
DOIs	https://doi.org/10.1063/1.1851615
State	Published - 10 Jan 2005

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title = "Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy",

abstract = "Atomically resolved room temperature scanning tunneling microscopy images of carbon nanotubes were obtained, and actual values of the nanotube dimensions were estimated from a line profile fitting analysis. It was found that the cross sectional deformation induced by the van der Waals forces between the CNTs and the substrate is much smaller in the double-walled carbon nanotubes than in the single-walled nanotubes.",

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AU - Lee, Cheol Eui

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AB - Atomically resolved room temperature scanning tunneling microscopy images of carbon nanotubes were obtained, and actual values of the nanotube dimensions were estimated from a line profile fitting analysis. It was found that the cross sectional deformation induced by the van der Waals forces between the CNTs and the substrate is much smaller in the double-walled carbon nanotubes than in the single-walled nanotubes.

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Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy

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