TY - JOUR
T1 - Ionic liquid additive induced holistic trap-passivation for enhanced charge transport in lead-halide perovskite-based transistors
AU - Nketia-Yawson, Benjamin
AU - Nketia-Yawson, Vivian
AU - Lee, Ji Hyeon
AU - Jo, Jea Woong
N1 - Publisher Copyright:
© 2024
PY - 2025/2/15
Y1 - 2025/2/15
N2 - Incorporating ionic liquid additives into perovskite-based electronic devices has been considerably demonstrated to improve device performance and stability via synergistic passivation effects. However, the advantages and understanding of ionic additives in perovskite field-effect transistors (FETs) have been explored far less. Herein, holistic trap-passivation is reported in a poly(3-hexylthiophene)-functionalized electrolyte-gated perovskite FETs with a solid-state ionic liquid (ss-IL) additive. The optimized ss-IL-incorporated methylammonium lead iodide (MAPbI3/ss-IL) FETs exhibited remarkable hole mobility of over 30 cm2 V−1 s−1 at an operating voltage of –1.5 V, attributed to suppressed lead/iodine vacancies and related traps and exhibiting excellent operational stability under ambient conditions with recoverable complex hysteresis behavior. These results demonstrate the promising synergistic impacts of the proposed trap engineering and provide a fundamental understanding of charge transport physics in doped perovskite semiconductors, essential for advancing their application as transistor-based devices.
AB - Incorporating ionic liquid additives into perovskite-based electronic devices has been considerably demonstrated to improve device performance and stability via synergistic passivation effects. However, the advantages and understanding of ionic additives in perovskite field-effect transistors (FETs) have been explored far less. Herein, holistic trap-passivation is reported in a poly(3-hexylthiophene)-functionalized electrolyte-gated perovskite FETs with a solid-state ionic liquid (ss-IL) additive. The optimized ss-IL-incorporated methylammonium lead iodide (MAPbI3/ss-IL) FETs exhibited remarkable hole mobility of over 30 cm2 V−1 s−1 at an operating voltage of –1.5 V, attributed to suppressed lead/iodine vacancies and related traps and exhibiting excellent operational stability under ambient conditions with recoverable complex hysteresis behavior. These results demonstrate the promising synergistic impacts of the proposed trap engineering and provide a fundamental understanding of charge transport physics in doped perovskite semiconductors, essential for advancing their application as transistor-based devices.
KW - Charge carrier mobility
KW - Ion migration
KW - Perovskite transistors
KW - Solid-state ionic liquid
KW - Trap passivation
UR - https://www.scopus.com/pages/publications/85207792276
U2 - 10.1016/j.apsusc.2024.161622
DO - 10.1016/j.apsusc.2024.161622
M3 - Article
AN - SCOPUS:85207792276
SN - 0169-4332
VL - 682
JO - Applied Surface Science
JF - Applied Surface Science
M1 - 161622
ER -