Abstract
Various methods have been suggested to realize freestanding or suspended graphene, which is expected to exhibit the intrinsic properties of graphene. However, in previously reported methods, multiple-step processes have been applied to produce freestanding graphene on a substrate. Here, we demonstrate that quasifreestanding graphene on a substrate can be realized through a simple single-step process. In this experiment, self-etching of nano-scale SiC steps of 8° off-axis vicinal SiC contributed to the formation of quasifreestanding graphene on an Si-faced SiC wafer, which was confirmed using low-energy electron diffraction, Raman spectroscopy, scanning electron microscopy and two-probe resistance measurements. Such a single-step technique for the growth of quasifreestanding graphene could pave the way towards graphene-based silicon-carbide micro-electronics.
| Original language | English |
|---|---|
| Pages (from-to) | 768-772 |
| Number of pages | 5 |
| Journal | Journal of the Korean Physical Society |
| Volume | 77 |
| Issue number | 9 |
| DOIs | |
| State | Published - Nov 2020 |
Keywords
- Low-energy electron diffraction
- Quasifreestanding graphene
- Raman spectroscopy
- Vicinal silicon carbide
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